Vertical GaN's Robustness in the Face of Adversity: An Update on Avalanche and Short Circuit Testing

NexGen's white paper provides an update on the robustness of their Vertical GaN technology, specifically its Avalanche and Short Circuit capability.

The paper discusses the significance of these capabilities for GaN transistor applications and presents test results that highlight the great avalanche and short circuit robustness qualities of GaN Fin-JFETs.